Author:
Noguchi Hiroki,Ikegami Kazutaka,Kushida Keiichi,Abe Keiko,Itai Shogo,Takaya Satoshi,Shimomura Naoharu,Ito Junichi,Kawasumi Atsushi,Hara Hiroyuki,Fujita Shinobu
Cited by
36 articles.
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5. High Sensing Margin Sensing Amplifier with Improved Reliability for STT-MRAM;2023 IEEE 23rd International Conference on Nanotechnology (NANO);2023-07-02