IC failure analysis: magic, mystery, and science-Reference-Cited by-同舟云学术

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IC failure analysis: magic, mystery, and science

Published:1997-07 Issue:3 Volume:14 Page:59-69
ISSN:0740-7475
Container-title:IEEE Design & Test of Computers
language:
Short-container-title:IEEE Des. Test. Comput.

Author:

Soden J.M.,Anderson R.E.,Henderson C.L.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software,Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx4/54/13300/00605998.pdf?arnumber=605998

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Surviving Information Leakage Hardware Trojan Attacks Using Hardware Isolation;IEEE Transactions on Emerging Topics in Computing;2019-04-01

2. A Marginal Isolation Failure Caused by Thin Film Quality Issue Analysis in a 45nm Logic Process;Applied Mechanics and Materials;2013-09

3. Research on security vulnerability of chip;SPIE Proceedings;2013-03-20

4. Single-bit failure analysis at a nanometer resolution by conductive atomic force microscopy;Microelectronics Reliability;2012-01

5. Trusted Design in FPGAs;Introduction to Hardware Security and Trust;2011-08-08

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