Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Radiation
Cited by
45 articles.
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1. A Novel Four-Port Calibration Method for High Frequency On-Wafer S-parameter Measurement;2023 International Conference on Microwave and Millimeter Wave Technology (ICMMT);2023-05-14
2. A Novel Four-Port Symmetric Probe Calibration Method for On-Wafer S-Parameter Measurement;IEEE Transactions on Microwave Theory and Techniques;2023
3. Calibration on the Fly—A Novel Two-Port S-Parameter Measurement Method for On-Wafer Leaky Systems;IEEE Transactions on Microwave Theory and Techniques;2020-08
4. Index;S-Parameters for Signal Integrity;2020-02-06
5. Symbolic Device Solutions;S-Parameters for Signal Integrity;2020-02-06