A Novel Four-Port Calibration Method for High Frequency On-Wafer S-parameter Measurement-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

A Novel Four-Port Calibration Method for High Frequency On-Wafer S-parameter Measurement

Published:2023-05-14 Issue: Volume: Page:
ISSN:
Container-title:2023 International Conference on Microwave and Millimeter Wave Technology (ICMMT)
language:
Short-container-title:

Author:

Zhou Jiefeng¹,Zhang Ling¹,Chen Junhui¹,Li Da¹,Zhou Ding²,Li Er-Ping¹

Affiliation:

1. Zhejiang University,College of Information Science and Electronic Engineering and The Zhejiang Key Laboratory of Advanced Micro/Nano Electronic Devices & Smart Systems and Applications,Hangzhou,China

2. High-Speed and High-Frequency Lab Huawei Technologies Co., Ltd,Dongguan,China

Funder

China Postdoctoral Science Foundation

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10275796/10276388/10277149.pdf?arnumber=10277149

Reference8 articles.

1. Singular-Value-Decomposition Based Four Port De-embedding and Single-step Error Calibration for On-chip Measurement

2. Parasitic Parameter Extraction for Calibration Standards Using an Optimization Strategy;zhou;IEEE Trans Microw Theory Techn,2022

3. Multi-Ports ([$2^{n}$) 2×-Thru De-Embedding: Theory, Validation, and Mode Conversion Characterization

4. Multimode TRL. A new concept in microwave measurements: theory and experimental verification

5. 16-term error model and calibration procedure for on-wafer network analysis measurements

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP