Determination of Diffusion Lengths With the Use of EBIC From a Diffused Junction With Any Values of Junction Depths-Reference-Cited by-同舟云学术

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Determination of Diffusion Lengths With the Use of EBIC From a Diffused Junction With Any Values of Junction Depths

Published:2006-09 Issue:9 Volume:53 Page:2358-2363
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Kurniawan O.,Ong V.K.S.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/16/35290/01677875.pdf?arnumber=1677875

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