Quantitative Specifications to Avoid Degradation during E-Beam and Induced Current Microscopy of Halide Perovskite Devices-Reference-Cited by-同舟云学术

Quantitative Specifications to Avoid Degradation during E-Beam and Induced Current Microscopy of Halide Perovskite Devices

Published:2020-08-03 Issue:35 Volume:124 Page:18961-18967
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Luo Yanqi¹^ORCID,Parikh Pritesh¹^ORCID,Brenner Thomas M.¹^ORCID,Kim Min-cheol¹,Wang Rui²^ORCID,Yang Yang²^ORCID,Correa-Baena Juan-Pablo³^ORCID,Buonassisi Tonio³,Meng Ying Shirley¹^ORCID,Fenning David P.¹⁴^ORCID

Affiliation:

1. Department of Nanoengineering, University of California San Diego, La Jolla, California 92093, United States

2. Department of Materials Science and Engineering and California NanoSystems Institute, University of California, Los Angeles, California 90095, United States

3. Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, United States

4. Chemical Engineering Program, University of California San Diego, La Jolla, California 92093, United States

Funder

California Energy Commission

NSF

DOE-EERE

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.0c06733

Reference55 articles.

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2. Sensitive X-ray detectors made of methylammonium lead tribromide perovskite single crystals

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4. Electrical and Optical Characterization of Surface Passivation in GaAs Nanowires

5. Strains, planes, and EBSD in materials science

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