Radiation Effects (Single Event Effects and Total Ionization Dose) on Commercial LP-DDR3 SDRAM for ESA JUICE Mission
Author:
Affiliation:
1. Hirex Engineering, a company of Alter Technology, member of TUV NORD Group,Ramonville Saint-Agne,France,31520
2. European Space Research and Technology Centre (ESTEC), European Space Agency (ESA),Noordwijk,AZ,The Netherlands,2201
Funder
European Space Agency
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9745606/9745637/09745703.pdf?arnumber=9745703
Reference6 articles.
1. Heavy Ion sensitivity of 16/32-Gbit NAND-Flash and 4-Gbit DDR3 SDRAM;grürmann;IEEE NSREC Data Workshop,0
2. In-Situ TID Test of 4-Gbit DDR3 SDRAM Devices
3. The proton irradiation facility at the Paul Scherrer institute;hadjas;Nucl Instr and Meth B,1996
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1. Compendium of SEE and TID Test Results for DDR4 SDRAM memories;2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS);2022-10-03
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