Cross-Calibration of Various SEE Test Methods Including Pulsed X-rays and Application to SEL and SEU-Reference-Cited by-同舟云学术

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Cross-Calibration of Various SEE Test Methods Including Pulsed X-rays and Application to SEL and SEU

Published:2019-09 Issue: Volume: Page:
ISSN:
Container-title:2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
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Author:

Augustin G.¹,Mauguet M.¹,Andrianjohany N.¹^ORCID,Chatry N.¹,Bezerra F.²,Capria E.³,Sander M.³,Voss K-O.⁴

Affiliation:

1. TRAD Tests & Radiations,Labège Cedex,France,31670

2. Centre National d'Etudes Spatiales (CNES),Toulouse Cedex,France,31401

3. European Synchrotron Radiation Facility (ESRF),Grenoble Cedex 9,France,38043

4. Gesellschaft für Schwerionenforschung mbH (GSI),Darmstadt,Germany,64291

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9745606/9745637/09745662.pdf?arnumber=9745662

Reference12 articles.

1. Investigation of Single-Event Transients in AlGaN/GaN MIS-Gate HEMTs Using a Focused X-Ray Beam

2. Single Event Transients Induced by Picosecond Pulsed X-Ray Absorption in III–V Heterojunction Transistors

3. Pulsed-Laser Testing for Single-Event Effects Investigations

4. Application of a Focused, Pulsed X-Ray Beam to the Investigation of Single-Event Transients in Al0.3Ga0.7N/GaN HEMTs

5. Single-Event Latchup in a CMOS-Based ASIC Using Heavy Ions, Laser Pulses, and Coupled Simulation

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. System-Level Total Ionizing Dose Testing of Satellite Subsystems: EagleEye Microsatellite Case Study;Electronics;2023-12-28

2. Quantitative Laser Testing for Predicting Heavy-Ion SEE Response – Part 1: Metrics for Assessing Response Agreement;IEEE Transactions on Nuclear Science;2023

3. Pulsed X-rays Induced Single Event Effects in Si, SiC and GaN Technologies;2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS);2022-10-03

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