System-Level Total Ionizing Dose Testing of Satellite Subsystems: EagleEye Microsatellite Case Study-Reference-Cited by-同舟云学术

System-Level Total Ionizing Dose Testing of Satellite Subsystems: EagleEye Microsatellite Case Study

Published:2023-12-28 Issue:1 Volume:13 Page:122
ISSN:2079-9292
Container-title:Electronics
language:en
Short-container-title:Electronics

Author:

Rajkowski Tomasz¹^ORCID,Pustułka Przemysław²,Bieda Marcin²,Ślasa Sylwia²,Kazaniecki Michał²^ORCID,Myszka Kamil²,Szczygielski Mateusz²,Iwaszkiewicz Jarosław²,Traczyk Konrad²,Tarenko Kamil²,Hołownia Adam²,Ładno Michał²,Bińczyk Piotr²,Wasilewski Szymon²,Mazur Marcin²,Zawistowski Tomasz²,Uznański Sławosz³,Kosiński Tymoteusz¹,Chabera Mariusz¹,Mazurek Krzysztof¹^ORCID,Klimaszewski Jan¹,Wasilewski Adam¹^ORCID,Matusiak Michał¹,Wronka Sławomir¹

Affiliation:

1. National Centre for Nuclear Research, 05-400 Otwock, Poland

2. Creotech Instruments S.A., 05-500 Piaseczno, Poland

3. CERN, 1211 Meyrin, Switzerland

Abstract

A system-level total ionizing dose test method of satellite subsystems is discussed in the context of the radiation qualification of a satellite. System-level tests are performed with high-energy X-rays, and the irradiation results of the key subsystems, including the on-board computer, attitude- and orbit-control-system computer, and battery management system, are presented and analyzed in terms of the repeatability of the results, the observability issues, and the importance of the test conditions. Furthermore, the main benefits of the system-level total ionizing dose tests of the given subsystems are discussed, as well as the risks related to performing tests at the system level.

Funder

NCBiR

European Union’s Horizon 2020

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Computer Networks and Communications,Hardware and Architecture,Signal Processing,Control and Systems Engineering

Link

https://www.mdpi.com/2079-9292/13/1/122/pdf

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