Author:
Guerin C.,Parthasarathy C.,Huard V.,Bravaix A.
Cited by
2 articles.
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1. Investigation of Threshold Voltage Shift for SiC MOSFET in Switching Operation;2023 IEEE 2nd International Power Electronics and Application Symposium (PEAS);2023-11-10
2. Reliability Analysis of Comparator: NBTI, PBTI, HCI, AGEING;Communications in Computer and Information Science;2018-10-10