Author:
Prabhu Deva Kumar Seelam V. Sai Viswanada,Akashe Shyam
Reference23 articles.
1. Alam, M.A., Mahapatra, S.: A comprehensive model of PMOS NBTI degradation. Microelectron. Reliab. 45, 71–81 (2005)
2. Kang, K., Kufluoglu, H., Roy, K., Alam, M.A.: Impact of negative-bias temperature instability in nanoscale SRAM array: modeling and analysis. IEEE Trans. Comput. Aided Des. Integr. Circ. Syst. 26(10), 1770–1780 (2007)
3. Zhuo, C., Sylvester, D., Blaauw, D.: Process variation and temperature-aware reliability management. In: Proceeding of Design, Automation & Test in Europe Conference & Exhibition (DATE), Dresden, Germany (2012)
4. Rahul, A.K.Y., Al Ayubi, H., Rizvi, N.Z.: Performance and reliability analysis for VLSI circuits using 45 nm technology. In: Proceeding of ICEEOT, International Conference, Chennai, India (2016)
5. Guerin, C., Parthasarathy, C.: New hot-carrier lifetime technique for high- to low-supplied voltage nMOSFETs. In: Proceedings of 14th IPFA, Bangalore (2007)
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