Considerations for Ultimate CMOS Scaling-Reference-Cited by-同舟云学术

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Considerations for Ultimate CMOS Scaling

Published:2012-07 Issue:7 Volume:59 Page:1813-1828
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Kuhn K. J.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/16/6218810/06200837.pdf?arnumber=6200837

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