An Age-Dependent Prognostic Model for Nonlinear Degrading Devices Based on Diffusion Process-Reference-Cited by-同舟云学术

An Age-Dependent Prognostic Model for Nonlinear Degrading Devices Based on Diffusion Process

Published:2023-05-01 Issue:9 Volume:23 Page:9500-9511
ISSN:1530-437X
Container-title:IEEE Sensors Journal
language:
Short-container-title:IEEE Sensors J.

Author:

Zhang Zhengxin¹^ORCID,Li Tianmei¹,Zhang Jianxun¹^ORCID,Du Dangbo¹,Si Xiaosheng¹^ORCID

Affiliation:

1. Zhijian Laboratory, Rocket Force University of Engineering, Xi’an, China

Funder

National Natural Science Foundation of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/7361/10113769/10076415.pdf?arnumber=10076415

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