Stochastic degradation modeling and remaining useful lifetime prediction based on long short-term memory network-Reference-Cited by-同舟云学术

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Stochastic degradation modeling and remaining useful lifetime prediction based on long short-term memory network

Published:2024-07 Issue: Volume:234 Page:114803
ISSN:0263-2241
Container-title:Measurement
language:en
Short-container-title:Measurement

Author:

Zezhou WANG,Jian Hou,Jiantai Zhu,Liyuan Wang,Zhongyi Cai

Funder

National Natural Science Foundation of China

Publisher

Elsevier BV

Reference42 articles.

1. Remaining useful life prediction for degradation with recovery phenomenon based on uncertain process;Zhang;Reliab. Eng. Syst. Saf.,2021

2. A hybrid prognostic method based on gated recurrent unit network and an adaptive wiener process model considering measurement errors;Chen;Mech. Syst. Sig. Process.,2021

3. A generalized remaining useful life prediction method for complex systems based on composite health indicator;Wen;Reliab. Eng. Syst. Saf.,2021

4. A data-driven approach with uncertainty quantification for predicting future capacities and remaining useful life of lithiumion battery;Liu;IEEE Trans. Ind. Electron.,2021

5. Machinery health prognostics: a systematic review from data acquisition to RUL prediction;Lei;Mech. Syst. Sig. Process.,2018

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