Automatic Measurement and Stress Analysis of ITO/PET Flexible Substrate by Shadow Moiré Interferometer With Phase-Shifting Interferometry
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/9425/6819099/06774868.pdf?arnumber=6774868
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