III-V gate-all-around nanowire MOSFET process technology: From 3D to 4D-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

III-V gate-all-around nanowire MOSFET process technology: From 3D to 4D

Published:2012-12 Issue: Volume: Page:
ISSN:
Container-title:2012 International Electron Devices Meeting
language:
Short-container-title:

Author:

Gu J. J.,Wang X. W.,Shao J.,Neal A. T.,Manfra M. J.,Gordon R. G.,Ye P. D.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/6471855/6478950/06479091.pdf?arnumber=6479091

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation of the One-Dimensional Semiconductor I₄Si₂ as a FET Channel Material;2024 47th MIPRO ICT and Electronics Convention (MIPRO);2024-05-20

2. Exploration and Analysis of Temperature and Performance of Compound Semiconductor-Based Junctionless GAA FET;IEEE Access;2024

3. Final Summary and Future of Advanced Ultra Low Power Metal Oxide Semiconductor Field Effect Transistors;Advanced Ultra Low‐Power Semiconductor Devices;2023-10-27

4. Demonstration of Germanium Vertical Gate-All-Around Field-Effect Transistors Featured by Self-Aligned High-κ Metal Gates with Record High Performance;ACS Nano;2023-10-12

5. Design of Hafnium Oxide (HfO<sub>2</sub>) Sidewall in InGaAs/InP for High-Speed Electronic Devices;Key Engineering Materials;2022-01-21

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP