Understanding RRAM endurance, retention and window margin trade-off using experimental results and simulations-Reference-Cited by-同舟云学术

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Understanding RRAM endurance, retention and window margin trade-off using experimental results and simulations

Published:2016-12 Issue: Volume: Page:
ISSN:
Container-title:2016 IEEE International Electron Devices Meeting (IEDM)
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Author:

Nail C.,Molas G.,Blaise P.,Piccolboni G.,Sklenard B.,Cagli C.,Bernard M.,Roule A.,Azzaz M.,Vianello E.,Carabasse C.,Berthier R.,Cooper D.,Pelissier C.,Magis T.,Ghibaudo G.,Vallee C.,Bedeau D.,Mosendz O.,De Salvo B.,Perniola L.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7824662/7838021/07838346.pdf?arnumber=7838346

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