A low-power, radiation-hardened Single Event Effect rate detection System on a Chip for Real Time Monitoring of Single Event Effects on Low Earth Orbit satellites-Reference-Cited by-同舟云学术

A low-power, radiation-hardened Single Event Effect rate detection System on a Chip for Real Time Monitoring of Single Event Effects on Low Earth Orbit satellites

Published:2022-10-03 Issue: Volume: Page:
ISSN:
Container-title:2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC)
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Author:

Kottaras Georgios¹,Sarris Theodoros²,Psomoulis Athanasios³,Ioakeimidis Ilias²,Papathanasiou Angelos¹,Pitchford David⁴,Sandberg Ingmar⁵

Affiliation:

1. Space ASICS S.A.,Athens,Greece

2. Democritus University of Thrace,Electrical & Computer Engineering,Xanthi,Greece

3. Democritus University of Thrace,Production & Management Engineering,Xanthi,Greece

4. CarringtonSpace,Germany

5. SPARC,Athens,Greece

Funder

European Space Agency

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9939277/9939284/09939638.pdf?arnumber=9939638

Reference6 articles.

1. Radiation tolerant VLSI circuits in standard deep submicron CMOS technologies for the LHC experiments: practical design aspects

2. Study of SEU Sensitivity of SRAM-Based Radiation Monitors in 65-nm CMOS

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