Efficient Data Recovery Technique for 3D TLC NAND Flash Memory based on WL Interference

Author:

Yang Liu,Wang Qi,Li Qianhui,Yu Xiaolei,He Jing,Huo Zongliang

Funder

National Key Research and Development Program of China

National Natural Science Foundation of China

Publisher

IEEE

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Innovative Programming Approaches to Address Z-Interference in High-Density 3D NAND Flash Memory;Electronics;2024-08-07

2. A review of the application of virtual and augmented reality in physical and occupational therapy;Software: Practice and Experience;2024-03-02

3. One-shot Read Processing to Enhance Cold Data Retention in Charge-trap TLC 3D NAND Flash;2023 IEEE 15th International Conference on ASIC (ASICON);2023-10-24

4. A Novel Data Recovery Technique for 3D TLC NAND Flash Memory Using Intercell Program;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03

5. Using Word Line (WL) Interference to Reduce Refresh Operations on 3D NAND Flash System;2021 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA);2021-11-24

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