Planning Repeated Degradation Testing for Products With Three-Source Variability-Reference-Cited by-同舟云学术

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Planning Repeated Degradation Testing for Products With Three-Source Variability

Published:2016-06 Issue:2 Volume:65 Page:640-647
ISSN:0018-9529
Container-title:IEEE Transactions on Reliability
language:
Short-container-title:IEEE Trans. Rel.

Author:

Zhang Zheng-Xin,Si Xiao-Sheng,Hu Chang-Hua,Zhang Qi,Li Tian-Mei,Xu Cong-Qi

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality

Link

http://xplorestaging.ieee.org/ielx7/24/7480880/07394200.pdf?arnumber=7394200

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Adaptive Wiener process–based remaining useful life prediction method considering multi-source variability;Heliyon;2024-08

2. Remaining Useful Life Prediction for Two-Phase Nonlinear Degrading Systems with Three-Source Variability;Sensors;2023-12-27

3. An Age-Dependent Prognostic Model for Nonlinear Degrading Devices Based on Diffusion Process;IEEE Sensors Journal;2023-05-01

4. Nonlinear Doubly Wiener Constant-Stress Accelerated Degradation Model Based on Uncertainties and Acceleration Factor Constant Principle;Applied Sciences;2021-09-26

5. Stochastic process-based degradation modeling and RUL prediction: from Brownian motion to fractional Brownian motion;Science China Information Sciences;2021-05-18

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