A Comparison of the Hard-Switching Performance of 650 V Power Transistors With Calorimetric Verification
Author:
Affiliation:
1. Department of Engineering Science, University of Oxford, Oxford, U.K.
2. School of Mechatronic Systems Engineering, Simon Fraser University, Surrey, BC, Canada
Funder
U.K. EPSRC
BorgWarner Inc.
Cambridge Design Partnership Ltd.
Ricardo Ltd.
YASA Ltd.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx7/8782709/10004734/10251536.pdf?arnumber=10251536
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3. Power Loss Characterization and Modeling for GaN-Based Hard-Switching Half-Bridges Considering Dynamic on-State Resistance
4. Tips and tricks on double pulse testing,2021
5. Power MOSFET basics understanding superjunction technology;siliconix,2015
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