Improvement and Sensitivity Analysis of Thermal Thin-Ice Thickness Retrievals-Reference-Cited by-同舟云学术

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Improvement and Sensitivity Analysis of Thermal Thin-Ice Thickness Retrievals

Published:2013-06 Issue:6 Volume:51 Page:3306-3318
ISSN:0196-2892
Container-title:IEEE Transactions on Geoscience and Remote Sensing
language:
Short-container-title:IEEE Trans. Geosci. Remote Sensing

Author:

Adams Susanne,Willmes Sascha,Schroder David,Heinemann Gunther,Bauer Martin,Krumpen Thomas

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Earth and Planetary Sciences,Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/36/6516939/06357238.pdf?arnumber=6357238

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