Can We Trust Machine Learning for Electronic Design Automation?-Reference-Cited by-同舟云学术

Can We Trust Machine Learning for Electronic Design Automation?

Published:2021-09-14 Issue: Volume: Page:
ISSN:
Container-title:2021 IEEE 34th International System-on-Chip Conference (SOCC)
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Author:

Liu Kang¹,Zhang Jeff Jun²,Tan Benjamin³,Feng Dan⁴

Affiliation:

1. Huazhong University of Science and Technology,School of Computer Science and Technology,Wuhan,China

2. Harvard University,School of Engineering and Applied Sciences,Cambridge,USA

3. New York University,Department of Electrical and Computer Engineering,USA

4. Huazhong University of Science and Technology,Wuhan National Laboratory for Optoelectronics,Wuhan,China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9739206/9739211/09739485.pdf?arnumber=9739485

Reference55 articles.

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4. Accurate process-hotspot detection using critical design rule extraction

5. Enhanced hotspot detection through synthetic pattern generation and design of experiments

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