Author:
Bacchetta N.,Bisello D.,Canali C.,Fuochi P.G.,Gotra Y.,Paccagnella A.,Verzellesi G.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
6 articles.
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1. An "edge-on" silicon strip detector for X-ray imaging;IEEE Transactions on Nuclear Science;1997-06
2. Design and evaluation of AC-coupled, FOXFET-biased, “edge-on” silicon strip detectors for X-ray imaging;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1997-01
3. FOXFET structure — device modelling and analysis;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1997-01
4. Radiation damage experience at CDF with SVX′;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1996-12
5. Forward and reverse characteristics of irradiated MOSFETs;IEEE Transactions on Nuclear Science;1996-06