Design and evaluation of AC-coupled, FOXFET-biased, “edge-on” silicon strip detectors for X-ray imaging-Reference-Cited by-同舟云学术

Design and evaluation of AC-coupled, FOXFET-biased, “edge-on” silicon strip detectors for X-ray imaging

Published:1997-01 Issue:2 Volume:385 Page:311-320
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Arfelli F.,Bonvicini V.,Bravin A.,Burger P.,Cantatore G.,Castelli E.,Di Michiel M.,Longo R.,Olivo A.,Pani S.,Pontoni D.,Poropat P.,Prest M.,Rashevsky A.,Tromba G.,Vacchi A.,Zampa N.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference15 articles.

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4. New developments in the field of silicon detectors for digital radiology

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