SET and SEU Hardened Clock Gating Cell
Author:
Affiliation:
1. IHP – Leibniz-Institut für Innovative Mikroelektronik,Frankfurt (Oder),Germany
Funder
Ministry of Education
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10335898/10335962/10335985.pdf?arnumber=10335985
Reference23 articles.
1. Overview of In-Orbit Radiation Induced Spacecraft Anomalies
2. Comparison of Combinational and Sequential Error Rates for a Deep Submicron Process
3. Ultra Low-Power Clocking Scheme Using Energy Recovery and Clock Gating
4. Novel SET Mitigation Technique for Clock Distribution Networks
5. Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree
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