Author:
Hao Peipei,Chen Shuming,Huang Pengcheng,Chen Jianjun,Liang Bin
Funder
State Key Program of National Natural Science Foundation of China
National Natural Science Foundation of China
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Cited by
6 articles.
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