gem5-FIM: a flexible and scalable multicore soft error assessment framework to early reliability design space explorations-Reference-Cited by-同舟云学术

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gem5-FIM: a flexible and scalable multicore soft error assessment framework to early reliability design space explorations

Published:2018-02 Issue: Volume: Page:
ISSN:
Container-title:2018 IEEE 9th Latin American Symposium on Circuits & Systems (LASCAS)
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Author:

Da Rosa Felipe Rocha,Reis Ricardo,Ost Luciano

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8392643/8399896/08717606.pdf?arnumber=8717606

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. BiGResi: Robust bit-level fault injection framework for assessing intrinsic software resilience against soft errors;Computers and Electrical Engineering;2024-05

2. Multicore soft error reliability assessment and evaluation of Compiler optimization flag Effects on ARMv7 and ARMv8;2023 IEEE 20th India Council International Conference (INDICON);2023-12-14

3. CAFI: A Configurable location-Aware Fault Injection technique for software reliability assessment against soft errors;Microprocessors and Microsystems;2022-10

4. GCFI: A High Accurate Compiler-based Fault Injection for Transient Hardware Faults;2022 CPSSI 4th International Symposium on Real-Time and Embedded Systems and Technologies (RTEST);2022-05-30

5. Modeling of single/multiple-bit upset effects on logic circuits applying Recurrent Neural Network;Microelectronics Journal;2021-11

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