Modeling of single/multiple-bit upset effects on logic circuits applying Recurrent Neural Network
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Published:2021-11
Issue:
Volume:117
Page:105249
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ISSN:0026-2692
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Container-title:Microelectronics Journal
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language:en
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Short-container-title:Microelectronics Journal
Author:
Farjaminezhad RasoulORCID, Safari S., Eftekhari Moghadam Amir Masood
Subject
General Engineering
Reference25 articles.
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