Multiple transient faults in logic: an issue for next generation ICs?-Reference-Cited by-同舟云学术

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Multiple transient faults in logic: an issue for next generation ICs?

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Container-title:20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05)
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Author:

Rossi D.,Omana M.,Toma F.,Metra C.

Publisher

IEEE Comput. Soc

Link

http://xplorestaging.ieee.org/ielx5/10366/32969/01544534.pdf?arnumber=1544534

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