Author:
Hirano T.,Kimura A.,Mori S.
Cited by
14 articles.
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1. Reducing Contact Resistance Using Compliant Nickel Nanowire Arrays;IEEE Transactions on Components and Packaging Technologies;2008-12
2. Fritting Contact Using SnAu probe;Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts;2007-09
3. Mechanism of ultra low force probing on Al electrodes;Electrical Contacts - 2006. Proceedings of the 52nd IEEE Holm Conference on Electrical Contacts;2006-09
4. Curled micro-cantilevers using benzocyclobutene polymer and Mo for wafer level probing;Sensors and Actuators A: Physical;2005-06
5. Characterization of fritting phenomena on Al electrode for low contact force probe card;IEEE Transactions on Components and Packaging Technologies;2003-06