On-Chip Integrated High-Sensitivity Temperature Sensor Based on p-GaN/AlGaN/GaN Heterostructure
Author:
Affiliation:
1. School of Electrical Engineering and Automation, Institute of Physical Science and Information Technology, Anhui University, Hefei, China
2. School of Microelectronics, University of Science and Technology of China, Hefei, China
Funder
National Natural Science Foundation of China
Anhui Innovation Project
Delta Power Electronics Science and Education Development Program of Delta Group
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/55/10081123/10044116.pdf?arnumber=10044116
Reference33 articles.
1. Enhanced Sensitivity of GaN-Based Temperature Sensor by Using the Series Schottky Barrier Diode Structure
2. Temperature Dependence of the Resistance of AlGaN/GaN Heterostructures and Their Applications as Temperature Sensors
3. Recessed Anode AlGaN/GaN Schottky Barrier Diode for Temperature Sensor Application
4. Effect of Anode Material on the Sensitivity of GaN Schottky Barrier Diode Temperature Sensor
5. Threshold Voltage Instability in p-GaN Gate AlGaN/GaN HFETs
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