Author:
Abu-Issa Abdallatif S.,Tumar Iyad K.,Ghanem Wasel T.
Cited by
5 articles.
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1. Efficient weight-based segmentation of scan-chains using NLFSR;2023 IEEE 20th India Council International Conference (INDICON);2023-12-14
2. Harvesting Wasted Clock Cycles for Efficient Online Testing;2023 IEEE European Test Symposium (ETS);2023-05-22
3. Enhanced DFT for Fortuitous Detection of Transition Faults During Scan Shift;2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS);2022-05-23
4. Analysis of Switching Activity in Various Implementation of Combinational circuit;2020 6th International Conference on Advanced Computing and Communication Systems (ICACCS);2020-03
5. Energy-Efficient Scheme for Multiple Scan-Chains BIST Using Weight-Based Segmentation;IEEE Transactions on Circuits and Systems II: Express Briefs;2018-03