A Deep Learning Approach to Detect and Classify Wheat Leaf Spot Using Faster R-CNN and Support Vector Machine-Reference-Cited by-同舟云学术

A Deep Learning Approach to Detect and Classify Wheat Leaf Spot Using Faster R-CNN and Support Vector Machine

Published:2023-04-07 Issue: Volume: Page:
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Container-title:2023 IEEE 8th International Conference for Convergence in Technology (I2CT)
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Author:

Bansal Ankit¹,Sharma Rishabh¹,Sharma Vikrant²,Jain Anuj Kumar¹,Kukreja Vinay¹

Affiliation:

1. Chitkara University,Chitkara University Institute of Engineering and Technology,Punjab,India

2. GraphicEra Hill University,Dehradun

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10126131/10126116/10126124.pdf?arnumber=10126124

Reference15 articles.

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4. An implementation and analysis of models for the detection of wheat rust disease;sood;International Conference on Intelligent Sustainable Systems,2020

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