Morphological and Electrical Characterization of Electrically Trimmable Thin-Film Resistors-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Morphological and Electrical Characterization of Electrically Trimmable Thin-Film Resistors

Published:2012-12 Issue:12 Volume:59 Page:3549-3554
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Privitera Stefania,Le Neel Olivier,Leung Calvin,Dumont-Girard Pascale,Cialdella Bruno,Bongiorno Corrado,Modica Roberto

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/16/6353354/06329943.pdf?arnumber=6329943

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Self-temperature compensated thin-film resistor;AIP Conference Proceedings;2024

2. A thermally optimizing method of thin film resistor trimming with machine learning;IEICE Electronics Express;2023-03-10

3. Modeling electrical resistivity of CrSi thin films;Solid-State Electronics;2022-12

4. Combined Thin-Film Resistive and Strain-Resistant Structures with Temperature Self-Compensation;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2022-12

5. Reliability Evaluations of SiCr Resistors in BCD IC Technologies;2021 IEEE International Integrated Reliability Workshop (IIRW);2021-10-04

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP