1. B-open Defect: A Novel Defect Model in FinFET Technology;ACM Journal on Emerging Technologies in Computing Systems;2022-12-09
2. Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model;2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID);2017-01
3. Test Escapes of Stuck-Open Faults Caused by Parasitic Capacitances and Leakage Currents;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2016-05
4. Circuit Parameter Independent Test Pattern Generation for Interconnect Open Defects;2014 IEEE 23rd Asian Test Symposium;2014-11
5. Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2013-02