Author:
Erb Dominik,Scheibler Karsten,Sauer Matthias,Reddy Sudhakar M.,Becker Bernd
Cited by
1 articles.
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1. Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model;2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID);2017-01