Testing systems wirelessly-Reference-Cited by-同舟云学术

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Testing systems wirelessly

Published: Issue: Volume: Page:
ISSN:
Container-title:22nd IEEE VLSI Test Symposium, 2004. Proceedings.
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Author:

Eberle H.,Wander A.,Gura N.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/9095/28867/01299261.pdf?arnumber=1299261

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. 2.4-GHz 10-Mb/s BFSK Embedded Transmitter With a Stacked-LC DCO for Wireless Testing Systems;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2013-09

2. Economic Analysis of the HOY Wireless Test Methodology;IEEE Design & Test of Computers;2010-05

3. SRCP: Simple Remote Control for Perpetual High-Power Sensor Networks;Lecture Notes in Computer Science;2009

4. CMOS IR-UWB Transceiver System Design for Contact-Less Chip Testing Applications;Series on Integrated Circuits and Systems;2009

5. MTNet: Design of a Wireless Test Framework for Heterogeneous Nanometer Systems-on-Chip;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2008-08

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