A multi-configuration strategy for an application dependent testing of FPGAs-Reference-Cited by-同舟云学术

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A multi-configuration strategy for an application dependent testing of FPGAs

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Container-title:22nd IEEE VLSI Test Symposium, 2004. Proceedings.
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Author:

Tahoori M.B.,McCluskey E.J.,Renovell M.,Faure P.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/9095/28867/01299239.pdf?arnumber=1299239

Cited by 21 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Application dependent FPGA interconnect test method with small test configuration number using SMT net-grouping constraints;IEICE Electronics Express;2024

2. A Novel Approach for Offline and Online Application-Dependent testing of FPGA interconnects;2023 5th Iranian International Conference on Microelectronics (IICM);2023-10-25

3. Evaluation of the SEU Faults Coverage of a Simple Fault Model for Application-Oriented FPGA Testing;2020 23rd Euromicro Conference on Digital System Design (DSD);2020-08

4. Application-Dependent Testing of FPGA Interconnect Network;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2019-10

5. Dependability Threats;Dependable Multicore Architectures at Nanoscale;2017-08-30

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