Author:
Singh Balwinder,Khosla Arun,Bindra Sukhleen
Cited by
10 articles.
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1. Switch Controlled State Skipping Based Memory Efficient Test Pattern Generator for BIST Application;2023 Second International Conference on Advances in Computational Intelligence and Communication (ICACIC);2023-12-07
2. Basics of VLSI Testing and Debug;Understanding Logic Locking;2023-09-23
3. Architectural Design of Built in Self-Test for VLSI Circuits using LFSR;2023 International Conference on Applied Intelligence and Sustainable Computing (ICAISC);2023-06-16
4. File encryption based on the process of comparing locations and values between images and a text file;2022 International Conference on Artificial Intelligence of Things (ICAIoT);2022-12-29
5. Design and Analysis of LFSR based Content Addressable Memory;2021 International Conference on Computing, Communication, and Intelligent Systems (ICCCIS);2021-02-19