Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software
Cited by
7 articles.
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1. Test Compression for Launch-on-Capture Transition Fault Testing;ACM T DES AUTOMAT EL;2024
2. Test Compression for Launch-on-Capture Transition Fault Testing;ACM Transactions on Design Automation of Electronic Systems;2023-11-15
3. Functionally Possible Scan-Based Test Set as a Dual of a Compressed Multicycle Test Set;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-04
4. Functional Test Sequences as a Source for Partially Functional Launch-on-Shift Tests;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2022-11
5. Functional Broadside Tests Under Broadcast Scan;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-10