Optimum simple ramp-tests for the Weibull distribution and type-I censoring-Reference-Cited by-同舟云学术

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Optimum simple ramp-tests for the Weibull distribution and type-I censoring

Published:1992 Issue:3 Volume:41 Page:407-413
ISSN:0018-9529
Container-title:IEEE Transactions on Reliability
language:
Short-container-title:IEEE Trans. Rel.

Author:

Bai D.S.,Cha M.S.,Chung S.W.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality

Link

http://xplorestaging.ieee.org/ielx1/24/4184/00159808.pdf?arnumber=159808

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