Optimal design of cyclic-stress accelerated life tests for lognormal lifetime distribution-Reference-Cited by-同舟云学术

Optimal design of cyclic-stress accelerated life tests for lognormal lifetime distribution

Published:2022-07-19 Issue:2 Volume:20 Page:236-255
ISSN:1684-3703
Container-title:Quality Technology & Quantitative Management
language:en
Short-container-title:Quality Technology & Quantitative Management

Author:

Kim Seung-Hyun¹,Sung Si-Il²

Affiliation:

1. DX Division, Samsung Electronics, South Korea

2. Department of Industrial and Systems Engineering, Kyonggi University, South Korea

Funder

This work was supported by the Ministry of Education of the Republic of Korea

Publisher

Informa UK Limited

Subject

Management of Technology and Innovation,Information Systems and Management,Management Science and Operations Research,Industrial relations,Business and International Management

Link

https://www.tandfonline.com/doi/pdf/10.1080/16843703.2022.2093577

Reference39 articles.

1. Optimal Simple Step-Stress Plan for Cumulative Exposure Model Using Log-Normal Distribution

2. Optimum simple ramp-tests for the Weibull distribution and type-I censoring

3. Optimum simple step-stress accelerated life tests for weibull distribution and type I censoring

4. Time-censored ramp tests with stress bound for Weibull life distribution

5. Point and Interval Estimation for a Simple Step-Stress Model with Type-II Censoring

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