Author:
Weimer C.,Sakalas P.,Muller M.,Fischer G. G.,Schroter M.
Cited by
8 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Next Generation SiGe HBTs for Energy Efficient Microwave Power Amplification (Invited);2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM);2024-03-03
2. Numerical Device Simulation Aided Study of RF-Stress-Caused Degradation in SiGe HBTs;2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS);2023-10-16
3. Nonlinear Compact Modeling of InP/InGaAs DHBTs with HICUM/L2;ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC);2023-09-11
4. RF Reliability of SiGe and InP HBTs: A Comparative Study;2023 IEEE/MTT-S International Microwave Symposium - IMS 2023;2023-06-11
5. Characterization, Analysis and Modeling of Long-Term RF Reliability and Degradation of SiGe HBTs for High Power Density Applications;IEEE Transactions on Device and Materials Reliability;2023