In-Situ Study of Dynamics of Refractive Index Changes in Silicon Devices Induced by UV-light Irradiation-Reference-Cited by-同舟云学术

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In-Situ Study of Dynamics of Refractive Index Changes in Silicon Devices Induced by UV-light Irradiation

Published:2022-08 Issue:4 Volume:14 Page:1-5
ISSN:1943-0655
Container-title:IEEE Photonics Journal
language:
Short-container-title:IEEE Photonics J.

Author:

Wang Jiaqi¹^ORCID,Wei Zhiwei¹,Qiu Huabin¹,Xing Zhengkun²^ORCID,Chen Yuzhi¹^ORCID,Geng Youfu¹^ORCID,Du Yu¹,Li Xuejin¹^ORCID,Cheng Zhenzhou²^ORCID

Affiliation:

1. College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China

2. School of Precision Instrument and Optoelectronics Engineering, Tianjin University, Tianjin, China

Funder

National Natural Science Foundation of China

Natural Science Foundation of Guangdong Province

Science and Technology Plan Project of Shenzhen

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics

Link

http://xplorestaging.ieee.org/ielx7/4563994/9795343/09793585.pdf?arnumber=9793585

Reference28 articles.

1. Vertically coupled microring resonators using one epitaxial growth step and single-side lithography

2. Athermal Hybrid Silicon/Polymer Ring Resonator Electro-optic Modulator

3. One-dimensional photonic crystal slot waveguide for silicon-organic hybrid electro-optic modulators

4. Heterogeneous Silicon Photonic Integrated Circuits

5. Practical Design of Lensed Fibers for Semiconductor Laser Packaging Using Laser Welding Technique

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