Analog network testability measurement: a symbolic formulation approach-Reference-Cited by-同舟云学术

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Analog network testability measurement: a symbolic formulation approach

Published:1991 Issue:6 Volume:40 Page:930-935
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Carmassi R.,Catelani M.,Iuculano G.,Liberatore A.,Manetti S.,Marini M.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx1/19/3426/00119770.pdf?arnumber=119770

Cited by 22 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Fast Algorithm for Testability Analysis of Large Linear Time-Invariant Networks;IEEE Transactions on Circuits and Systems I: Regular Papers;2017-06

2. A Testability Measure for DC-Excited Periodically Switched Networks With Applications to DC-DC Converters;IEEE Transactions on Instrumentation and Measurement;2016-10

3. An unconditionally sound algorithm for testability analysis in linear time-invariant electrical networks;International Journal of Circuit Theory and Applications;2015-11-02

4. Parametric reduction of Jacobian matrix for fault analysis;2010 International Conference on Microelectronics;2010-12

5. Algebraic Approach to Ambiguity-Group Determination in Nonlinear Analog Circuits;IEEE Transactions on Circuits and Systems I: Regular Papers;2010-02

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