A Simple and Useful Layout Scheme to Achieve Uniform Current Distribution for Multi-Finger Silicided Grounded-Gate NMOS-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

A Simple and Useful Layout Scheme to Achieve Uniform Current Distribution for Multi-Finger Silicided Grounded-Gate NMOS

Published:2007-04 Issue: Volume: Page:
ISSN:
Container-title:2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual
language:
Short-container-title:

Author:

Lee Jian-Hsing,Wu Yi-Hsun,Tang Chin-Hsin,Peng Ta-Chih,Chen Shui-Hung,Oates Anthony

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/4227591/4227592/04227705.pdf?arnumber=4227705

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Robust HV Power pLDMOS Components for ESD Protection by the Drain-side Parasitic Schottky Diode and SCR Engineering;2022 International Power Electronics Conference (IPEC-Himeji 2022- ECCE Asia);2022-05-15

2. HV ESD Device Solution Evaluations in 55nm BCD Technology;2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA);2021-09-15

3. Improvement of electrostatic discharge current-handling capability for high-voltage multi-finger nLDMOS devices with self-triggered technique;Semiconductor Science and Technology;2020-05-11

4. Improving Safe-Operating-Area of a 5-V n-Channel Large Array MOSFET in a 0.15- $\mu$ m BCD Process;IEEE Transactions on Electron Devices;2018-07

5. Improving ESD protection of 5 V NMOSFET large array device in 0.4 μm BCD process;Microelectronics Reliability;2018-05

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP