Evidence for defect-generation-driven wear-out of breakdown conduction path in ultra thin oxides-Reference-Cited by-同舟云学术

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Evidence for defect-generation-driven wear-out of breakdown conduction path in ultra thin oxides

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Container-title:2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual.
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Author:

Monsieur F.,Vincent E.,Ribes G.,Huard V.,Bruyere S.,Roy D.,Pananakakis G.,Ghibaudo G.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/8520/26927/01197785.pdf?arnumber=1197785

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