Author:
Nakajima Y.,Dohi T.,Sasama T.,Momoi Y.,Sugano N.,Tamura Y.,Sung-hwan Lim ,Sakuma I.,Mitsuishi M.,Koyama T.,Yonenobu K.,Ohashi S.,Bessho M.,Ohnishi I.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Cited by
7 articles.
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