Author:
Thomas N.J.,Davis J.R.,Keen J.M.,Castledine J.G.,Brumhead D.,Goulding M.,Alderman J.,Farr J.P.G.,Earwaker L.G.,L'Ecuyer J.,Stirland I.M.,Cole J.M.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
18 articles.
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1. Electrical Isolation Applications of PSi in Microelectronics;Porous Silicon: From Formation to Applications: Optoelectronics, Microelectronics, and Energy Technology Applications, Volume Three;2016-01-07
2. Porous Silicon Characterization and Application: General View;Porous Silicon: From Formation to Application: Formation and Properties, Volume One;2015-10-29
3. Oxidized Porous Silicon Based SOI: Untapped Resources;Progress in SOI Structures and Devices Operating at Extreme Conditions;2002
4. A Low Temperature Silicon‐on‐Insulator Fabrication Process Using Si MBE on Double‐Layer Porous Silicon;Journal of The Electrochemical Society;1998-05-01
5. Total gamma dose characteristics of CMOS devices in SOI structures based on oxidized porous silicon;IEEE Transactions on Nuclear Science;1997-10